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力学性能对Bi-2223/Ag超导带材临界电流影响实验研究

STUDY ON THE EFFECTS OF MECHANICAL PROPERTIES ON CRITICAL CURRENT OF Bi-2223/Ag TAPES

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【作者】 宋春梅吴云龙刘华军教晓东王正道熊玉峰李来风

【Author】 Song CHun-Mei~ 1,2 Wu Yun-Long~ 1,3 Liu Hua-Jun~ 1,3 Jiao Xiao-Dong~ 1,3 Wang Zheng-Dao~ 1,4 Xiong Yu-Feng~ 1,5 Li Lai-Feng~1 ~ 1 Technical Institute of Physics and Chemistry,Beijing 100080 ~ 2 Department of physics, Zunyi Normal College, Zun Yi 563002 ~ 3 Graduate college, Chinese Academy of Sciences, Beijing 10039 ~ 4 Institute of Mechanics, Beijing Industry University, Beijing 100080 ~ 5 National center for nanoscience and technology, Beijing 100080

【机构】 中国科学院理化技术研究所中国科学院理化技术研究所 北京100080遵义师范学院物理系遵义563002北京100080中国科学院研究生院北京100039北京工业大学北京100022中国国家纳米科学中心

【摘要】 本文主要研究了在77K温度下,拉伸应变和弯曲应变对Bi-2223/Ag超导带材临界电流的影响,得到了超导带材的临界电流随拉伸强度、曲率半径变化规律.实验结果显明,拉伸作用在超导带材上产生的形变对其临界电流(Ic)的影响存在一个临界值εirr=0.3%.形变小于此临界值,Ic变化较小,超过此临界值,临界电流急剧下降.弯曲实验同样存在类似关系.同步辐射光源对超导带材检测表明,在形变情况下,超导氧化物陶瓷芯的微裂纹迅速增加和交织是Ic降低的主要原因.

【Abstract】 Effects of mechanical properties on the critical current of Bi-2223/Ag tapes have been studied at 77K. There is a critical value. The conductors critical current (I_ c ) keeps nearly constant when the tensile strain is low than the critical value. As tensile strain increase, I_ c decreases slowly at the beginning, and then degrades sharply near 0.3% of strain. Degradations of I_ c caused by the bending strain are in good agreement with the tensile testing results. Synchrotron radiation shows that the degradation of I_ c is related directly with propagation of micro-crack in the oxide layer under tensile tests.

  • 【文献出处】 低温物理学报 ,Chinese Journal of Low Temperature Physics , 编辑部邮箱 ,2006年01期
  • 【分类号】TM26
  • 【被引频次】3
  • 【下载频次】161
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