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GaN基紫光LED的可靠性研究
Research on the reliability of GaN-based violet LED
【摘要】 测量了GaN 基紫光 LED 的光功率(P)在不同工作电流和环境温度(室温和60℃)下随时间的变化,研究了 LED 的可靠性.结果表明,紫光 LED 的功率在前48h 内迅速衰减,而在48h 后衰减速率减慢;与光功率的衰减规律相对应,其 I-V 曲线的变化显示反向漏电流和正向小电压下的电流都有明显的增加.对载流子的输运机制的分析表明,在 LED 的工作过程中,缺陷提供的辅助电流通道使载流子的辐射复合几率降低,LED 光功率下降.
【Abstract】 Optical power of violet light emitting diodes were measured during DC aging test up to 312h at different current levels(20 and 40mA),and different ambient temperatures(room temperature and 60℃).It was found that violet LED optical power decreased drasmaticaly with aging time within 48 h and slowly after 48h.Analyzing the I-V curve of virgin violet LED and aged ones,tunneling current is the main component of reverse current and forward current at low bias.It is believed that tunneling current increases mainly because large amount of defects,which provides opportunity of electron tunneling from n-GaN to p-GaN involving unradiative recombination processes.
【Key words】 inorganic non-metallic materials; GaN; violet-LED; reliability;
- 【文献出处】 材料研究学报 ,Chinese Journal of Materials Research , 编辑部邮箱 ,2006年02期
- 【分类号】TN312.8
- 【被引频次】17
- 【下载频次】509