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氮化硅多孔陶瓷的制备及微波介电性能研究

Study on the Microwave Dielectric Property of Porous Silicon Nitride Ceramics

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【作者】 李军奇罗发朱冬梅周万城

【Author】 Li Junqi, Luo Fa, Zhu Dongmei, Zhou Wancheng (State Key Laboratory of Solidification Processing, Northwestern Polytechnical University, Xi’an 710072, China)

【机构】 西北工业大学凝固技术国家重点实验室西北工业大学凝固技术国家重点实验室 陕西西安710072陕西西安710072

【摘要】 通过添加成孔剂,采用反应烧结工艺制备出具有不同气孔率的氮化硅多孔陶瓷。采用阿基米德法、三点弯曲法测试了材料的密度、气孔率及抗弯强度。用XRD及扫描电镜对相组成和显微结构进行了研究,用谐振腔法测试了该氮化硅陶瓷在9360 MHz频率的微波介电特性。结果表明,随着试样中气孔率的增加,试样的介电常数下降;在Si粉中添加α-Si3N4粉后,虽能提高氮化率,改善组织结构,但外加Si3N4和基体生产的Si3N4存在活性差异,两者结合不紧密,使强度降低;加入α-Si3N4粉使晶相组成中Si2ON2的含量降低,能够改善试样的介电性能。

【Abstract】 This paper presents the microwave dielectric property of porous silicon nitride ceramics at a frequency of 9360 MHz, which were fabricated by the nitridation of silicon powder. The porous ceramics with different volume fractions of porosity from 18.6% to 56.2% were produced by adding different amounts of the pore-forming agent into the initial silicon powder. Microstructural analysis revealed a dense matrix containing large pores with needle-shaped and flakyβ-Si3N4 grains distributing in it. The results showed that the dielectric constant of the ceramics decreases with increasing of the porosity. Addingα-Si3N4 powder in the raw silicon powder, the nitridation rate raises, and the dielectric constant and the dielectric loss of the ceramics decrease notablely.

【基金】 国家自然科学基金资助(50572090)
  • 【文献出处】 稀有金属材料与工程 ,Rare Metal Materials and Engineering , 编辑部邮箱 ,2006年S2期
  • 【分类号】TQ174.1
  • 【被引频次】21
  • 【下载频次】625
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