节点文献

溅射气氛对氟碳疏水薄膜表面结构及性能的影响

Influence of RF Sputtering Pressure on Surface Composition and Properties of Fluorocarbon Hydrophobic Films

  • 推荐 CAJ下载
  • PDF下载
  • 不支持迅雷等下载工具,请取消加速工具后下载。

【作者】 徐慢谢毅周学东袁启华赵修建

【Author】 XU Man,XIE Yi,ZHOU Xuedong,YUAN Qihua,ZHAO Xiujian(Key Laboratory of Silicate Materials Science and Engineering, Ministry of Education, Wuhan University of Technology, Wuhan 430070)

【机构】 武汉理工大学硅酸盐材料工程教育部重点实验室武汉理工大学硅酸盐材料工程教育部重点实验室 武汉430070武汉430070

【摘要】 以聚四氟乙烯(PTFE)为靶材,用射频磁控溅射方法在玻璃衬底上制备了氟碳高分子薄膜,并对其结构和表面性能进行了研究。由XPS的结果可知,构成薄膜的大分子由-CF-、-CF2-和-CF3等组分组成。随着氩气压强的增加,缺氟基团-C-增加,而-CF2-、-CF3等富氟基团以及F/C均减少;随着氮气偏压的增加,-CF-、-CF2-和-CF3以及F/C和N/C增加。同时探讨了溅射气氛对薄膜表面形貌、疏水性能及表面能的影响。

【Abstract】 Fluorocarbon polymer films are prepared by radio-frequency (RF) magnetron sputtering of polytetrafluoroethylene (PTFE). The paper shows that the surface composition and chemical structure of the films vary with altering the argon and nitrogen gas pressure. X-ray photoelectron spectroscopy (XPS) measurements show that the as-deposited films reveal the C1s spectra containing peaks -CF-,-CF2- and -CF3 bonding, etc. With increasing of Argon pressure, the content of -C- units increases while the concentration of -CF2-, -CF3 and ratio of F/C etc decrease. The contents of -CF-, -CF2-, -CF3 groups, F/C and N/C increase with the increasing of nitrogen partial pressure. The effect of gas pressure on the surface morphology, hydrophobic properties and surface energy of as-deposited films is also discussed.

【关键词】 磁控溅射薄膜聚四氟乙烯疏水性
【Key words】 magnetron sputteringthin filmsPTFEhydrophobility
【基金】 国家“863”计划资助项目(2002AA335030)
  • 【分类号】TB383.2
  • 【被引频次】4
  • 【下载频次】211
节点文献中: 

本文链接的文献网络图示:

本文的引文网络