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溅射气氛对氟碳疏水薄膜表面结构及性能的影响
Influence of RF Sputtering Pressure on Surface Composition and Properties of Fluorocarbon Hydrophobic Films
【摘要】 以聚四氟乙烯(PTFE)为靶材,用射频磁控溅射方法在玻璃衬底上制备了氟碳高分子薄膜,并对其结构和表面性能进行了研究。由XPS的结果可知,构成薄膜的大分子由-CF-、-CF2-和-CF3等组分组成。随着氩气压强的增加,缺氟基团-C-增加,而-CF2-、-CF3等富氟基团以及F/C均减少;随着氮气偏压的增加,-CF-、-CF2-和-CF3以及F/C和N/C增加。同时探讨了溅射气氛对薄膜表面形貌、疏水性能及表面能的影响。
【Abstract】 Fluorocarbon polymer films are prepared by radio-frequency (RF) magnetron sputtering of polytetrafluoroethylene (PTFE). The paper shows that the surface composition and chemical structure of the films vary with altering the argon and nitrogen gas pressure. X-ray photoelectron spectroscopy (XPS) measurements show that the as-deposited films reveal the C1s spectra containing peaks -CF-,-CF2- and -CF3 bonding, etc. With increasing of Argon pressure, the content of -C- units increases while the concentration of -CF2-, -CF3 and ratio of F/C etc decrease. The contents of -CF-, -CF2-, -CF3 groups, F/C and N/C increase with the increasing of nitrogen partial pressure. The effect of gas pressure on the surface morphology, hydrophobic properties and surface energy of as-deposited films is also discussed.
- 【文献出处】 材料导报 ,Materials Review , 编辑部邮箱 ,2006年06期
- 【分类号】TB383.2
- 【被引频次】4
- 【下载频次】211