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一种基于采样直线组的局部纹线周期估计方法

A Method Based on the Group of Sampling lines for Local Ridge Period Estimation in Fingerprint Image

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【作者】 孙俊喜孙忠森向长波宋健中

【Author】 SUN Junxi~(1,2),SUN Zhongsen~1,XIANG Changbo~1,SONG Jianzhong~1(1.Changchun Institute of Optic Fine mechanies and Physics,Changchun 1300332.College of Electronics and Information Engineering,Changchun University of Science and Technology,Changchun 130022)

【机构】 中国科学院长春光学精密机械与物理研究所中国科学院长春光学精密机械与物理研究所 130033长春理工大学电信学院长春130022130033

【摘要】 利用一组平行采样直线,计算局部纹线周期。首先将整幅图像分块,在每个块内,做和块纹线方向垂直的一组平行采样直线,然后对每条直线上的像素二值化,通过此直线上纹脊和纹谷的宽度,计算出若干纹线周期,对这些纹线周期统计平均,作为该图像块的纹线周期。实验表明,本方法合理,可行的。

【Abstract】 Local fingerprint image ridge period is estimated based on a group of sampling lines.Firstly,the fingerprint image is divided into non-overlap blocks.In each block,a group of sampling lines are done alone the line normal to the ridge direction.Secondly,ridge period is computed through the ridge and valley distance after binarization of the pixels in the line.Thirdly, local ridge period is obtained by the statistical average of some ridge period in each block.The experiment results show the method is reasonable and feasible.

【基金】 长春光机所项目
  • 【分类号】TP391.41
  • 【被引频次】1
  • 【下载频次】30
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