【摘要】 通过对电子器件加速试验失效模型———Arrhenius模型的研究,发现加速试验过程中,失效机理不发生改变时,电子器件失效敏感参数的退化速率与施加应力的负倒数遵从指数关系,从而提出了一种加速试验失效机理一致性的判定方法.对样品3DG130进行了150~310℃的序进应力加速试验,快速得到了失效机理一致的应力范围,验证了该方法的可行性.更多还原

【Abstract】 Through the study of a failure mechanism model--the Arrhenius model--of electronic devices in accelerated testing,it is found that the relation between the rate of degradation of failure sensitive parameters and the negative reciprocal of operating stress follows an exponential rule in accelerated testing.Based on the relationship,a failure-mechanism identification method in accelerated testing is presented.Then a progress-stress accelerated test is constructed in the temperature range of 150～310℃,and the consistent failure-mechanism range proves that the method is feasible.更多还原