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GaN的ECR-PEMOCVD生长中衬底清洗和氮化的分析
RHEED Analys of Cleaning and Nitriding of Substrates in GaN Films Growth by ECR-PEMOCVD
【摘要】 在改进的电子回旋共振(ECR)等离子体增强金属有机物化学汽相沉积(ECR-PEMOCVD)装置(ESPD-U)中,以氮等离子体为氮源,三乙基镓(TEG)为镓源,在蓝宝石(α-Al2O3)衬底上生长氮化镓(GaN)薄膜。在不同的温度、氮氢流量下,分别对α-Al2O3衬底进行等离子体清洗和氮化, 并用RHEED实时监测。通过对RHEED图像的分析,得出衬底清洗和氮化的最佳条件。
【Abstract】 GaN thin films were prepared on sapphire (α-Al2O3) substrates in an improved electron-cyclotron-resonance plasma-enhanced metal organic chemical vapor deposition (ECR-PEMOCVD) system (ESPD-U) with nitrogen plasma and the triethyl gallium (TEG) as precursors, α-Al2O3 substrates were cleaned and nitrified by plasma at different temperatures and flux of nitrogen and hydrogen, by using RHEED monitoring in-situ . The best conditions of cleaning and nitriding of substrates were determined from the analysis of the RHEED images.
- 【文献出处】 半导体技术 ,Semiconductor Technology , 编辑部邮箱 ,2006年03期
- 【分类号】TN304.05
- 【被引频次】1
- 【下载频次】189