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薄膜厚度对ZnO∶Al透明导电膜性能的影响
Thickness Dependence of Properties for ZnO∶Al Transparent Conducting Films
【摘要】 铝掺杂的氧化锌 (ZnO∶Al)透明导电膜是采用射频磁控溅射法在有机衬底 (Polypro pyleneadipate,PPA)和Corning 70 5 9玻璃上制备的。详细研究了薄膜的结构性质、光学和电学性质随薄膜厚度的变化关系。制备的ZnO∶Al薄膜具有 (0 0 2 )面的单一择优取向的多晶六角纤锌矿结构 ,性能优良的薄膜电阻率在两种衬底上分别为 2 .5 5× 1 0 - 3 Ω·cm和1 .89× 1 0 - 3 Ω·cm ,平均透射率达到了 80 %和 85 %。
【Abstract】 The ZnO∶Al films with different thickness were deposited on Corning 7059 glass and PPA substrates using a r.f. magnetron sputtering system. The thickness dependence of structural, optical and electrical properties of the ZnO∶Al films on polypropylene adipate (PPA) substrates have been studied in detail. Good films with resistivity as low as 2.55×10 -3 Ω·cm, 1.89×10 -3 Ω·cm and 80%, 85% transmittance in the visible region on glass and PPA substrates were prepared, respectively.
【Key words】 aluminum-doped zinc oxide film; film thickness; flexible substrates;
- 【文献出处】 液晶与显示 ,Chinese Journal of Liquid Crystals and Displays , 编辑部邮箱 ,2002年03期
- 【分类号】O484.4
- 【被引频次】38
- 【下载频次】361