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小角散射中干涉效应的消除法

Eliminating Method of Interference Effect in Small Angle X-ray Scattering

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【作者】 许彧华许曼华

【Author】 Xu Yuhua Xu Manhua Lect., Dept. of Mathematics, Guangdong Province Part Time University of Science and Technology, Guangzhou 510091, China.

【机构】 广东省成人科技大学武汉理工大学

【摘要】 用小角散射测粒度分布 ,用的是各颗粒自身的散射强度 ,而实测的强度总包含有干涉部分 ,不易分开 ;考虑到在测非晶态的结构中 ,用的是各个原子散射光之间的干涉效应。这样就可借用非晶测量中的方法将干涉去掉 ,从而得到各颗粒自身的散射强度分布

【Abstract】 In small angle X ray scattering, the measurement for particle distribution was used the scattered intensity of the particle himself. But in fact the measured intensity always contained the interference effect and is difficult to separate. We consider that in measure the construction of amorphous material, was used the interference effect between the scattering beam of every atom. We can use this method of measure in amorphous to eliminate the interference effect and to take the distribution of scattering intensity of every particle himself.

  • 【文献出处】 武汉理工大学学报 ,Journal of Wuhan University of Technology , 编辑部邮箱 ,2002年05期
  • 【分类号】O72
  • 【被引频次】2
  • 【下载频次】70
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