【摘要】 在不考虑冒险的情况下 ,对于CMOS电路中的开路故障 ,探讨了利用FAN算法进行瞬态电流测试产生的可能性 .定义了三种不同的D前沿 ,并将测试产生分为激活故障、使无故障电路和故障电路的瞬态电流差别最大化、减少旁路的影响三个部分 .实验结果说明 ,在不考虑冒险的情况下 ,将FAN算法应用于瞬态电流测试产生是可行的 .更多还原

【Abstract】 This paper explores the feasibility for transient current test (I DDT)generation for stuck-open fault in CMOS circuits assumed that hazards are not considered in the circuits.Three different D-fronts are defined.Three parts of test generation are given in the paper:① to excite fault;② to maximize the I DDT difference between the fault-free circuit and fault circuit;③ to minimize the effect of bypass.The experimental results show that when hazards are not considered,it is possible for us to use FAN algorithm to generate test patterns for I DDT test更多还原