【摘要】 本文介绍了一种新的相位测量轮廓术 ,通过使用不同栅距的栅获得两幅包裹相位图 ,然后比较这两幅包裹相位图 ,求得物体上任一像素点的绝对相位值 ,从而确定物体上任一点的高度 .这种方法的优点是实验过程简单 ,精度高 ,相位的求解在整个过程中是单独进行的 ,不需借助相邻点 ,所以求得的相位值是各点的绝对相位 ,而且它可测量高度上中跳跃的物体的面形 .更多还原

【Abstract】 A method of absolute phase determination in profilometry is proposed. In the method, two wrapped phases are acquired by using two different period gratings, the absolute phase at each pixel is then unwrapped by comparing the two wrapped phases. The main advantage of the method is that it is accurate, and that the absolute phase is obtained automatically.更多还原