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X射线衍射法测定分子筛晶胞参数与结晶度
DETERMINATION OF CRYSTALLINITY AND LATTICE PARAMETERS OF SYNTHETIC MOLECULAR SIEVE BY X-RAY DIFFRACTION
【摘要】 用X射线衍射外推函数法测定饱和吸水前后NaY分子筛的晶胞参数和结晶度 ,再与2 9Si和2 7Al固体魔角核磁共振谱仪所测定的NaY分子筛骨架中的硅铝比进行关联 ,得到了X射线衍射法测定NaY分子筛骨架中硅铝比的经验公式 ,达到了测定NaY分子筛骨架中硅铝比的要求。试验结果表明 ,测定NaY分子筛晶胞参数和结晶度的有效方法是在测定前对分子筛进行稳化处理 ,使其饱和吸水 ,比通常采用的化学方法省时 ,结果准确 ,重复性好
【Abstract】 The latice parameters and crystallinity of NaY molecular sieve before and after absorbing water were determined with extension function method of X-ray diffraction. By relating the lattice parameters to the framework Si/Al ratio of NaY molecular sieve determined by solid nuclear magnetic resonant spectrum method, an empirical formula with which the Si/Al ratio can be obtained from the lattice parameters was given. The results have shown that this method is simpler and more convenient and has better repeatability than that of the methods of chemical analysis. It is notable that before determination, the molecular sieve must be treated for stabilization in order to let it be saturated by water.
【Key words】 Lattice parameter; Crystallinity; NaY molecular sieve; Si/Al ratio;
- 【文献出处】 理化检验(物理分册) ,Physical Testing and Chemical Analysis Parta Physical Testing , 编辑部邮箱 ,2002年07期
- 【分类号】O643.3
- 【被引频次】22
- 【下载频次】908