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掺杂(Co,Nb,Pr)的SnO2介电与压敏性质

Dielectric and Varistor Properties of (Co, Nb, Pr)-doped SnO2

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【作者】 王矜奉陈洪存王文新苏文斌臧国忠赵春华

【Author】 WANG Jin-feng, CHEN Hong-cun, WANG Wen-xin, SU Wen-bin,ZANG Guo-zhong, ZHAO Chun-hua(School of Physics and Microelectronics, Shandong University, Jinan 250100, China; Department of Physics, Binzhou Teacher’ s College, Binzhou 256604, China)

【机构】 山东大学物理与微电子学院滨州师专物理系 山东 济南 250100山东 济南 250100山东 滨州 256604

【摘要】 研究了(Co,Nb,Pr)掺杂的SnO2材料介电和压敏性质.当Pr6O11的量分数从0%增加到0.1%时,SnO2压敏电阻的相对介电常数从670降到280,击穿电压从827V/mm猛增到2 150V/mm.微观结构分析发现:当Pr6O11的量分数从0%增加到0.1%时,SnO2的晶粒尺寸由4.50μm迅速减小到1.76μm.晶界势垒高度测量揭示SnO2的晶粒尺寸迅速减小是介电常数迅速减小及击穿电压急剧增高的原因.对Pr增加引起SnO2晶粒减小的根源也进行了解释.

【Abstract】 The effect of rare - earth Pr on the dielectric and varistor properties of the(Co, Nb, Pr) -doped SnO2 was investigated. The relative dielectric constant of the SnO2 based varistors decreased from 670 to 280 and the breakdown voltage increased significantly from 827V/mm to 2150V/mm with increasing Pr6O11 concentration from 0% to 0.1%. Measurement of the barrier height at grain boundaries reveal that the significant decrease of the SnO2 grain size, from 4.50 to 1.76μm with increasing Pr6O11 concentration from 0% to 0.1%, is the reason for lowering the dielectric constant and raising the breakdown voltage. The origin for the deduction of SnO2 grain size with increasing Pr6O11 concentration was explained.

【基金】 国家自然科学基金(50072013)
  • 【文献出处】 哈尔滨理工大学学报 ,Journal of Harbin University of Science and Technology , 编辑部邮箱 ,2002年06期
  • 【分类号】TN304.93
  • 【被引频次】9
  • 【下载频次】104
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