【摘要】 对薄层结构的复合材料及多层电路板进行密度分布情况及分层成像的研究 ,是无损检测技术的一个重要应用领域。通过实验可观察到 ,在接近焦平面时图像的灰度值有一定的非线性 ,提出了一种新的成像方法 ,可以提高灵敏度 ,非线性的层面合成可以仅仅从很少的投影中重建物体 ,并使测量时间大大减少更多还原

【Abstract】 The inspection of flat components like soldered joints with complex structures is a very important application of non destructive test and requires high sophisticated nondestructive testing methods. A new non linear reconstruction method will be put forward in this paper. The object is irradiated by X ray under different angles. After preprocessing the complete object image is reconstructed plane by plane. In comparison to computer tomography, the digital laminography is always a limited angle reconstruction. Therefore, the applied algorithm depends on the object geometry and structure as well as the requested accuracy and structure type.更多还原