节点文献
用非接触光探针平整度仪对液晶器件的研究
Surface Measurement of LCD Substrate by Noncontact Light Probe Flatness Tester
【摘要】 介绍一种具有纳米级测量灵敏度的非接触光探针平整度测试仪 ,其分辨率优于 1nm。这种测试仪在电子玻璃、半导体、集成电路、薄膜和纳米技术等领域都有很大的应用前景。给出了该测试仪在液晶显示器件基板表面形状研究方面的一些应用的实验测试数据结果 ,表明该测试仪可以在液晶显示器件研究中发挥作用
【Abstract】 A kind of flatness tester with noncontact light probe is introduced. It has the accuracy of nanometer, with a resolution of 1 nm, and measuring range of 10 μm. This kind of tester shows a great practical prospect in the applications of electronic glass, semiconductor, integrated circuit, thin films and technology of nanometer. Some of the testing results in the study of liquid crystal device (LCD) substrate surface shapes by the tester are presented and the results indicate that this kind of tester can be used in LCD study and play an important role in it.
- 【文献出处】 光学学报 ,Acta Optica Sinica , 编辑部邮箱 ,2002年07期
- 【分类号】TN141
- 【下载频次】80