节点文献
CVD金刚石薄膜的掺硼研究
Boron Doping in CVD Diamond Films
【摘要】 采用固体三氧化二硼 ,在单晶硅 (10 0 )衬底上用微波CVD法生长金刚石薄膜和进行 p型掺杂 ,对不同掺杂碳源浓度下CVD金刚石薄膜的掺杂和生长行为、薄膜表面形貌、薄膜的电性能等进行了研究 .结果表明 ,硼确实已掺入金刚石膜中 ;在SEM下观察到硼掺杂金刚石膜结构致密没有孔洞 ;用Ti和Ag分别在掺杂金刚石薄膜表面制备电极 ,测试了在不同温度下电流随温度的变化。
【Abstract】 Boron doped diamond thin films are grown by microwave CVD method. The dopant is solid B 2O 3,which locates in a round groove on the sample holder. The research is concerned of the CVD diamond growth condition, the film morphology and their electrical properties. It is showed that boron has been incorporated into the diamond films. Ti and Ag electrodes are made on doped film surfaces respectively, the current passed through the two electrodes is measured at different temperaturs.
【基金】 国家自然科学基金资助项目 ( 5 0 0 82 0 0 5 )
- 【文献出处】 机械工程材料 ,Materials For Mechanical Engineering , 编辑部邮箱 ,2002年01期
- 【分类号】TB43
- 【被引频次】33
- 【下载频次】407