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一种提高硅集成电感Q值的方法

A method for improving quality factor (Q) of integrated inductor on silicon

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【作者】 刘畅陈学良严金龙

【Author】 LIU Chang, CHEN Xue-liang, YAN Jin-long(Microelectronics Branch, Shanghai Institute of Metallurgy, Chinese Academy of Sciences, Shanghai 200233, China)

【机构】 中国科学院上海冶金研究所微电子学分部中国科学院上海冶金研究所微电子学分部 上海200233上海200233上海200233

【摘要】 设计和制作了硅集成电感,采用常规的硅工艺,在衬底形成间隔的pn结隔离来减少硅衬底的涡流损耗。实验测量了硅集成电感的S参数并研究了衬底结隔离对硅集成电感的电感量和品质因素(Q)的影响。结果表明一定深度的衬底结隔离能有效地使电感Q值提高40%。

【Abstract】 Integrated Inductors on silicon were designed and fabricated,and a method was applied to reduce the silicon substrate eddy currents. The method to form the p-n junction isolation in the Si substrate can be realized in standard silicon technologies without additional processing steps. S para- meters of the inductors were investigated based on equivalent circuit. Experimental results show that substrate p-n junction isolation at certain depth achieves good improvement may increase the in- ductor quality factor up to 40%.

【关键词】 集成电感Q值涡流
【Key words】 integrated inductorquality factoreddy currents
  • 【文献出处】 功能材料与器件学报 ,Journal of Functional Materials and Devices , 编辑部邮箱 ,2002年01期
  • 【分类号】TN431
  • 【被引频次】12
  • 【下载频次】128
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