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织构和界面粗糙度对NiFe/FeMn双层膜交换偏置场的影响

Effect of texture and interfacial roughness on the exchange bias field of NiFe/FeMn films

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【作者】 李明华于广华朱逢吾姜宏伟赖武彦

【Author】 LI Ming hua 1,2 , YU Guang hua 1, ZHU Feng wu 1,JIANG Hong wei 2, LAI Wu yan 2 (1.Department of Material Physics, Beijing University of Science and Technology, Beijing 100083,China; 2.Institute of Physics, Chinese Academy of Sciences, Beij

【机构】 北京科技大学材料物理系中国科学院物理研究所中国科学院物理研究所 北京100083.中国科学院物理研究所北京100080北京100083北京100080

【摘要】 采用磁控溅射方法制备NiFe/FeMn双层膜 (分别以Ta、Cu作为缓冲层 ,Ta作为保护层 )。实验发现 ,以Ta为缓冲层的NiFe/FeMn双层膜的交换偏置场比以Cu为缓冲层的NiFe/FeMn双层膜的交换偏置场大 ,而矫顽力却很小。我们从织构、界面粗糙度两方面对其中的原因进行了分析。以Ta为缓冲层的NiFe/FeMn双层膜有好的织构且NiFe/FeMn界面较平滑 ,这引起了较强的交换偏置场和较低的矫顽力。

【Abstract】 The NiFe/FeMn bilayers with different buffer layers (Ta or Cu) and Ta cover layers were prepared by magnetron sputtering. The results showed that the exchange bias field of NiFe/FeMn films with the Ta buffer was higher than that of the films with the Cu buffer, but the coercivity of former was lower than that of later. We analysed the reasons by studying the crystallographic texture and interfacial roughness. The Ta buffer promoted the formation of the strongly (111) texture and smooth interface, which results in the strong exchange bias field and low coercivity.

【基金】 国家自然科学基金重大资助项目 (1 9890 31 0 )
  • 【文献出处】 功能材料 ,Journal of Functional Materials , 编辑部邮箱 ,2002年02期
  • 【分类号】O484.5
  • 【被引频次】3
  • 【下载频次】129
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