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二次微分与样条小波自卷积联用分辨重叠伏安峰

Spline Wavelet Self-Convolution Combined with Quadratic Differential for Processing Overlapped Voltammetric Peaks

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【作者】 张永清莫金垣谢天尧蔡沛祥

【Author】 ZHANG Yong qing, MO Jin yuan *, XIE Tian yao, CAI Pei xiang (College of Chemistry and Chemical Engineering, Zhongshan University, Guangzhou, 510275, P.R.China)

【机构】 中山大学化学与化学工程学院中山大学化学与化学工程学院 广州510275广州510275

【摘要】 本文采用二次微分法寻找重叠峰的各个峰位置 ,再利用样条小波自卷积( SWSC)方法直接对重叠的伏安峰进行处理 ,取得了较好的结果。被处理的重叠峰可达到基线分离 ,且峰位置的相对误差小于 3.0 % (完全掩盖峰为 5 .39% ) ,峰面积的相对误差小于 2 .0 %。方法应用于铅 ( ) -铊 ( )体系的微分脉冲伏安信号处理 ,取得满意的结果

【Abstract】 Spline wavelet self convolution (SWSC) is used to resolve overlapped peaks directly after the peak number and peak positions of overlapped peak are found by quadratic differential. Baseline separation can be achieved for the processed peaks. The relative errors of peak position are less than 3.0% except the covered peak (its relative error of peak position is 5.39%), and the relative errors of peak area are less than 2.0%. Overlapped voltammetric peaks of Pb(Ⅱ) Tl(Ⅰ)mixtures are investigated by this method and satisfactory results are obtained.

【基金】 国家自然科学基金 (No.2 9975 0 3 3 ) ;广东省自然科学基金 (No.980 3 40 )
  • 【文献出处】 分析科学学报 ,Journal of Analytical Science , 编辑部邮箱 ,2002年01期
  • 【分类号】O651
  • 【被引频次】13
  • 【下载频次】128
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