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荧光衰减曲线的一种多指数拟合方法
A Method for Multi-exponential Fitting to the Fluorescence Decay
【摘要】 在荧光衰减测量中 ,总要遇到荧光衰减解卷积 ,进行非线性参数拟合问题。目前已有的非线性求极小值方法 ,都对参数估计值非常敏感 ,而且计算程序运行时间较长。我们建立了一种基于经典的步长加速法实现非线性最小二乘拟合 ,进行荧光衰减解卷积的方法 ,按程序给出参数初值 ,即能解卷积
【Abstract】 Among the established techniques for measuring fluorescence decay rate, time-correlated single-photon counting (TCSPC) provides unusually high sensitivity, and is, widely used. Sample’s decay curves measured by the TCSPC system contain the system’s respond function. In order to get the real decay curve of the sample, we have to do the deconvolution. For that, we need a method to do the nonlinear fitting. By now those established nonlinear fitting method have the problem that resolution is sense to the given initial value, and need too much time to do the calculation. To overcome those disadvantages, we build up a new method to do the fitting. The method is based on the practical pace-accelerated means. It has nice precision and good repetition. For a common value, it can easily work out a fairly good resolution. Using this program, we analyzed some sample’s decay curve. The result shows that the new method is useful for the fitting to the fluorescence decay curves.
- 【文献出处】 发光学报 ,Chinese Journal of Luminescence , 编辑部邮箱 ,2002年01期
- 【分类号】O482.31
- 【被引频次】24
- 【下载频次】1071