【摘要】 利用高温超导体磁屏蔽原理研制了一种双面超导薄膜的临界参数无损测量系统 .该系统有 2 9个传感器 ,可以无损地测出双面薄膜中的任一面的临界参数 (Tc、Jc)值 .该系统用液氮冷却 .可测量最大薄膜直径为 75mm .全系统由计算机实现自动控制 .更多还原

【Abstract】 With the development of HTSC double sided films, a simple, fast, and nondestructive determination system for the quality of the films is necessary. In this paper, a new type of equipment to determine critical parameters of HTSC double sided films by using magnetic shielding principle is introduced. This equipment can determine both T\-c and J\-c of 30 points on double sided films with diameters less than 75mm(or 50mm). The determination is non destructive and computer controlled.更多还原