【摘要】 对 Zn O压敏电阻片生产过程中因造粒混合不均匀 ,烧成时温度气氛的差别 ,匣钵密封不良等因素 ,造成电阻片微观结构不均匀进行了研究 ;针对少数电阻片漏流超标 (大于 30μA) ,其老化性能也差的情况 ,提出了一种对漏流超标的电阻片进行特定热处理和低温热处理方法 ,使漏流降低 ,各项电气性能均得到了改善更多还原

【Abstract】 In production of ZnO varistor, some aspects such uniform mixing while making powder, temperature atmosphere difference in sintering poor sealing of sintering vessel, and so on, may result in microstructure inhomogeneous of ZnO varistor, It in found usually that there are some varistors whose leakage current exrrent exceed prescript value in inspection(exceed 30μA),they have a bad aging performance in The paper proposed a special annealing method and low temperature annealing method is proposed to improve leakage current and other electrical characteristics of ZnO varistor.更多还原