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投影法CCD测径系统

CCD Measuring System for Wire Diameter Using Projection Method

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【作者】 李为民俞巧云裘凌红

【Author】 Li Weimin Yu Qiaoyun Qiu Linghong Department of Precision Machinery and Precision Instrumentation, University of Science and Technology of China, Hefei 230027

【机构】 中国科学技术大学精密机械与精密仪器系!合肥市230027

【摘要】 文中介绍以线阵CCD作为光电传感器的投影放大法线径测量系统 ,着重分析提高系统稳定性和测量精度的方法。系统以半导体激光器为光源 ,成像系统采用物方远心光路。对阴影图像进行一阶微分并求其局部重心点作为其边缘特征点。对光学系统放大倍数和成像系统像差分别进行线性、非线性标定以提高测量精度

【Abstract】 This paper introduces the system for diameter measurement using projection and magnification method with the linear CCD detector. The paper mainly discusses the method of improving the accuracy and stability. The measuring system uses the laser diode as the light source and the infinite objective of optical system .It gets the first-order differential of the shadow image, and acquires its local center of gravity as the characteristics of the edge. To improve the accuracy, the system calibrates the magnification and the aberration of the optical system with the linear and nonlinear method.

【关键词】 尺寸测量CCD投影法
【Key words】 Size MeasurementLinear CCDProjection Meth?
  • 【文献出处】 仪表技术与传感器 ,Instrument Technique and Sensor , 编辑部邮箱 ,2001年01期
  • 【分类号】TP274
  • 【被引频次】31
  • 【下载频次】406
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