【摘要】 使用 X射线光电子能谱 (XPS)和扫描电子显微镜 (SEM)等表面分析方法 ,研究未启封、使用过未失效和使用过失效的继电器触点表面的形貌、组份和结构 .结果表明 ,经过使用后触点表面烧蚀严重并发生磨损 ,其组份中含 Ag、Sn、C和 O等原子 .C和 O的 XPS峰显示 ,触点表面氧化膜和碳化物的形成 ,导致接触电阻增大 ,从而影响继电器的稳定性和使用寿命更多还原

【Abstract】 The methods of scanning electron microscopy(SEM) and X ray photoelectron spectroscopy(XPS) were used to observe and measure the electrical contact surface. The experimental results show that the contact point surface after continual operation has been ablated and worn. The surface layer contains Ag?Sn?C?O elements etc. The XP spectra of C ls and O ls show that the formation of oxide film and carbide results in an increase of contact resistance and sequentially affects the stability and useful life of electromagnetic relay.更多还原