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用高密度电阻率法进行空洞探测的几个问题

SOME PROBLEMS IN THE APPLICATION OF HIGH DENSITY RESISTIVITY METHOD TO CAVITY EXPLORATION

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【作者】 郭秀军王兴泰

【Author】 GUO Xiu jun 1,WANG Xing tai 2 (1.Ocean University of Qingdao, Qingdao 266003, China; 2.Changchun University of Science and Technology, Changchun 130026, China)

【机构】 青岛海洋大学地学院!山东青岛266003长春科技大学!吉林长春130026

【摘要】 通过大量的正演计算 ,重点阐明了利用高密度电阻率法进行洞室探测的前提、不同采集装置异常形态特征及判别方式、对相邻洞体的分辨能力和提高洞室探测定量解释精度的方法 ,明确了该项技术在洞室探测应用中的模糊点 ,提高了该项技术的应用效果。

【Abstract】 Based on large quantities of forward calculation, this paper deals emphatically with the prerequisite of applying high density resistivity method to cavity exploration, characteristics and discrimination modes of anomalous shapes related to different collection devices, the resolution capacity for neighboring cavities, and the technique for improving the quantitative interpretation precision in cavity exploration. It also makes clear the ambiguous points of this method in cavity exploration with the purpose of improving its application effects.

  • 【文献出处】 物探与化探 ,Geophysical and Geochemical Exploration , 编辑部邮箱 ,2001年04期
  • 【分类号】P631.3
  • 【被引频次】118
  • 【下载频次】500
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