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用场发射显微镜研究单壁碳纳米管场发射
A STUDY OF FIELD EMISSION OF SINGLE-WALLED CARBONNANOTUBES USING FIELD EMISSION MICROSCOPY
【摘要】 利用场发射显微镜在小于 4 0× 10 - 7Pa压强条件下研究了单壁碳纳米管微束在不同温度加热除气后的场发射变化 ,得出随着除气温度的升高 ,碳纳米管逸出功经历了从大到小再变大的变化过程 .在清洁态 (10 0 0℃除气 )对应有最小的逸出功 ,此时场发射图像显示出一定的细致结构 .继续升高温度 ,碳纳米管发生塌缩 .
【Abstract】 Using Field Emission Microscopy (FEM), the electron field emission from a bundle of single-walled carbon nanotubes (SWCNT’s) was studied under vacuum better than 4.0×10 -7 Pa after being thermo-desorbed at different temperatures.Work function of the SWCNT’s decreases as the temperature of desorption goes up.After heat treatment at 1000℃, the SWCNT’s exhibits the lowest work function and their electron field emission pattern also shows a fine structure.As the temperature for thermo-desorption is raised further, the SWCNT’s field emission power deteriorates and finally collapse of SWCNT’s occurs.
【Key words】 electron field emission; field emission microscopy; single-walled carbon nanotubes; work function;
- 【文献出处】 物理学报 ,Acta Physica Sinica , 编辑部邮箱 ,2001年09期
- 【分类号】TB383
- 【被引频次】16
- 【下载频次】114