节点文献
对Si(Li)探测器测谱中产生伪峰现象的分析
ANALYZING THE PHENOMENA OF FAKE PEAK PRODUCED IN Si(Li) DETECTOR’S MEASURING SPECTRUM
【Abstract】 The Be window is destroyed by chance during using the Si(Li) detector.After it is repaired,the detector is used to measure characteristic X ray of following elements of V,Fe,Ni,Cu,Zn and Pb.The concomitent fake peak appears going with the photoelectric peak of above mentioned elements,and the ratio of two peaks’ energy is nearly a constant.By experiment test and reason analysis,it is found that the fare peak is resulted from Li ions’ contrary diraction drift in Si(Li) detector,which is caused by the suddenly sharp change of outward the degree of vacuum and high voltage.
- 【文献出处】 四川大学学报(自然科学版) ,Journal of Sichuan University (Natural Science Edition) , 编辑部邮箱 ,2001年01期
- 【分类号】TL81
- 【下载频次】36