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滤光片及X射线二极管响应面均匀性研究
The study for surface uniformity of the response of the filter and X-ray diode
【摘要】 介绍了用于软 X光能谱测量的滤光片及 X射线二极管能量响应均匀性研究。实验利用北京同步辐射装置 3W1B束线 ,流强 4 0~ 80 m A的运行条件 ,在 10 0~ 160 0 e V能区对滤光片及 X射线二极管 ( XRD)作能响曲线标定。重点对 C滤片及 Al阴极 XRD的灵敏面作能响面均匀性研究 ,最后给出响应面均匀性测量结果及计算分析。
【Abstract】 The study of surface uniformity of the response of the filter and X ray diode to measure soft X ray spectrum is reported. The Beijing synchrotron radiation facility 3W1B with beam current 40~80mA, and photon energy 100~1600eV is used. The energy response for the filter and X ray diode has been calibrated. Primarily, the surface uniformity of response for carbon filter and X ray diode with aluminum cathode have been studied. Finally, the experimental curve of the surface uniformity for the C filter and XRD(Al) are given and analyzed.
【Key words】 filter X ray diode; surface uniformity of response; synchrotron radiation facility;
- 【文献出处】 核电子学与探测技术 ,Nuclear Electronics & Detection Technology , 编辑部邮箱 ,2001年02期
- 【分类号】O434.14
- 【被引频次】2
- 【下载频次】56