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用于GaSb/AlGaAsSb器件制备的新型化学腐蚀液研究
Study of a new etchant for GaSb/AlGaAsSb device fabrication
【摘要】 提出了一种适用于 GaSb/AlGaAsSb器件工艺的由氢氟酸、酒石酸和双氧水构成的氢氟酸 系腐蚀液。该腐蚀液对于 GaSb和 AlGaAsSb材料具有良好的腐蚀特性和稳定的刻蚀速率。选用 合适的溶液组份可以得到较低的刻蚀速率,有利于在器件工艺中进行精确控制。实验中发现该腐 蚀液对 AlGaAsSb的腐蚀速率与其 Al组份呈抛物线关系,在合适的 Al组份下可对 AlGaAsSb和 GaSb两种材料进行非选择性的刻蚀。
【Abstract】 A new etchant consists of hydrofluoric acid, peroxide and tartaric acid for the chemical etch- ing of GaSb/AlGaAsSb materials has been studied. Results show that this etchant has a stable etching rate to both GaSb and AlGaAsSb compound materials; under suitable solution composition quite low etching rate could be obtained, which are useful for the fabrication of GaSb/AlGaAsSb devices. Para- bolic relation between the etching rate of AlGaAsSb materials and their Al content was found, un- selective etching could be performed for GaSb and AlGaAsSb material with certain Al content.
【Key words】 GaSb/AlGaAsSb compound semiconductor; Chemical etching; Optoelectronic devices;
- 【文献出处】 功能材料与器件学报 ,Journal of Functional Materials and Devices , 编辑部邮箱 ,2001年01期
- 【分类号】TN305
- 【被引频次】2
- 【下载频次】107