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高温超导薄膜微波表面电阻测试方法
A Measurement Method of Microwave Surface Resistance of Large Area High Tc Super-conductive Thin Films
【摘要】 介绍一种工作在12 GHz附近的高温超导薄膜微波表面电阻sR测试系统,该系统采用低损耗高介电常数的蓝宝石构成工作在TE011+δ谐振模式的介质谐振器,在77 K时,利用它对高温超导薄膜的微波表面电阻sR进行测试,提高了整个测试系统的品质因素,可成功地用于单片φ50.8 mm较大超导薄膜的无损伤测试,整个测试系统体积小、操作方便,且所需实验条件简单,测试灵敏度高,具有简便、快捷、适合于工业化生产检测的特点。
【Abstract】 The surface resistance sR of a single piece of high Tc super-conductive thin film can be measured by a sapphire resonator with d+TE011mode non-destructivity, at 77K. By measuring the value of the resonator抯 quality factor, the microwave surface resistance sR of testing sample can be also determined. A new measuring method is presented, and the surface resistance can be calculated. To measure ?0.8mm high Tc super-conductive thin film, a special sapphire resonator working at 12GHz is made and used. The method has advantages of non-destructivity, single sample,high Q value, high sensitivity, convenient experiment setup, small volume, and flexibility in operation.
【Key words】 high Tc super-conductive; microwave surface resistance; sapphire resonator; quality factor;
- 【文献出处】 电子科技大学学报 ,Journal of University of Electronic Science and Technology of China , 编辑部邮箱 ,2001年06期
- 【分类号】TM26
- 【被引频次】12
- 【下载频次】170