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SrBi2Ta2O9薄膜的制备和铁电性能研究
Study on the Preparation and Ferroelectric Properties of SrBi2Ta2O9 Thin Films
【摘要】 用一种新的低温过程制备了SrBi2Ta2O9铁电薄膜。在Sol-Gel方法中用Pt/Ti/SiO2/Si作衬底,研究了薄膜的结构和电特性。SrBi2Ta2O9薄膜在淀积Pt上电极之前和之后都要退火,第一次退火在760乇氧压下600℃时退火30分钟,在第二次退火后薄膜结晶良好。
【Abstract】 A new low temperature processing method for preparation of SrBi2Ta2O9 thin films is proposed. These thin films were prepared on Pt/Ti/SiO2/Si substrates by a sol-gel method,their structural and electrical properties are investigated.Films are annealed before and after the top Pt electrode deposition.The lst annealing is performed in a 760 Torr oxygen atmosphere at 600℃ for 30 min, and the films are well crystallized and find grained after the 2nd annealing.
- 【文献出处】 信息记录材料 ,Magnetic Recording Materiais , 编辑部邮箱 ,2001年04期
- 【分类号】O614
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