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6H-SiC电子输运的Monte Carlo模拟

MONTE CARLO SIMULATION OF ELECTRON TRANSPORT IN 6H-SiC

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【作者】 尚也淳; 张义门; 张玉明;

【Author】 SHANG YE\|CHUN\ ZHANG YI\|MEN\ ZHANG YU\|MING (Microelectronics Institute,Xidian University,Xi’an\ 710071,China)

【机构】 西安电子科技大学微电子所!西安710071;

【摘要】 从实际测量和单粒子MonteCarlo模拟两个方面研究了 6H SiC的电子输运规律 ,在模拟中考虑了 6H SiC主要的散射机理 ,模拟的结果体现了 6H SiC具有良好的高温和高场特性以及迁移率的各向异性 ,其横向迁移率和纵向迁移率相差近 5倍 .模拟结果和实验数据的对比说明了对 6H SiC输运特性的模拟是正确的 .

【Abstract】 Temperature\|and electric field\|dependent electron transport in 6H\|SiC has been studied by single\|particle Monte Carlo technique,and the Hall electron mobility in 6H\|SiC has been measured over the temperature range 77?K<T<700?K.The physical model used in the simulation is developed considering the main scattering mechanisms in details.The results show the excellent high\|temperature and high field properties as well as anisotropy of mobility.The ratio μ ‖c /μ ⊥c in 6H\|SiC is nearly 5,and the saturation velocity v\-s is 2×10\+7?cm/s.The simulated results are in good agreement with measured data in a wide range of temperature and electric field.

【关键词】 6H-SiC; Monte Carlo模拟; 迁移率; 散射机理;
【Key words】 H-SiC; Monte Carlo study; mobility; electron scattering;
  • 【文献出处】 物理学报 ,ACTA PHYSICA SINICA , 编辑部邮箱 ,2000年09期
  • 【分类号】O481
  • 【被引频次】7
  • 【下载频次】174
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