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2.4μm GaInAsSb红外探测器台面腐蚀研究
The Investigation of Mesa Etching for 2 .4μm GaInAsSb Infrared detectors
【摘要】 本文提出了适于2.μm GaInsSb台面结构探测器制备的HF/H2O2/ C4H6O6/H2O腐蚀液体系,并确定了合适的成分配比。实验结果表明,该腐蚀液 体系对GaInAsSb材料腐蚀速度适中、侧向腐蚀小、不破坏光刻胶保护、腐蚀面 平整、腐蚀槽齐整、受外延付表面质量影响较小。
【Abstract】 The mesa etching of 2 .4μm GaInAsSb infrared detectors has been investigated in this present work, a etchant consisting of hydrofluoric acid, hydroge peroxide, tartic acid and water for the chemical etching GaInAsSb/GaSb materials has been proposed and a suit- able ratio of this etchant for fabricating 2.4μm GaInAsSb infrared detectors has been deter- mined by experiment results. This will be better the surface passivation of GaInAsSb in- frared detectors.
【基金】 国家863高技术研究发展计划!课题代号863-715-0152
- 【文献出处】 微电子技术 ,Microelectronic Technology , 编辑部邮箱 ,2000年04期
- 【分类号】TN21
- 【下载频次】37