【摘要】 用 RIA法、EL ASAI等方法测定 92例 2型糖尿病并血管并发症患者、90例单纯 2型糖尿病患者及 40例正常人的血浆 ET、NO、IAI等指标并进行比较。结果 :2型糖尿病并血管并发症组较单纯 2型糖尿病组及正常对照组IAI显著降低 ,血浆 ET水平升高 ,NO水平降低 ,IAI与 ET水平呈负相关 ,与 NO呈正相关 ,ET与 NO呈负相关。结论 :胰岛素抵抗、血浆 ET水平升高、NO水平降低与 2型糖尿病血管并发症的发生、发展关系密切更多还原

【Abstract】 WT5”BZ]The levels of plasma ET,NO and IAI of 92 cases type 2 diabetes with vascular complication,90 cases without complication and 40 cases normal persons were measured and compared by a RIA or on ELASAI mothod Result showed the levels of NO and IAI were significantly lower and levels of ET were higher in diabetes with vascular complication than that in normal persons and diabetes without vascular complication These suggested insulin resistance,increased plasma ET and decreased plasma NO R58 played an important role in the progress of vascular complication in type 2 diabets [WT5”HZ]更多还原