节点文献
X光CCD响应特性
Study on Response of X-ray Charge Coupled Device to Soft-X-ray
【摘要】 在北京同步辐射源上建立了 X光 CCD量子效率实验标定方法 ,获得了 1 50 e V~ 1 50 0 e V能区范围多个 X光能点的量子效率实验结果 ,发展了 X光 CCD量子效率简化计算模型 ,并对 X光 CCD表面油沾污对量子效率的影响进行了实验研究和修正
【Abstract】 Response of X-ray charge coupled device (CCD) to soft X rays were cali brated on Beijing Synchrotron Radiation Facility, and the experimental results h ave been obtained in photon energy range of 150eV to 1500eV. Then, a simple mode l was developed to simulate the calibrated results. The effect of CCD surface contamination on C CD response to X rays has also been investigated.
【基金】 国家863惯性约束聚变领域及高温高密度等离子体物理重点实验室资助课题!(99JS77.4.1zs770 2 )
- 【文献出处】 强激光与粒子束 ,HIGH POWER LASER & PARTICLE BEAMS , 编辑部邮箱 ,2000年05期
- 【分类号】TN24
- 【被引频次】21
- 【下载频次】120