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双卡簧片失效分析
FAILURE ANALYSIS OF DOUBLE CLIP REED
【摘要】 采用光学金相、扫描电镜、电子探针成分分析和显微硬度测定等方法分析了双卡簧片非正常断裂的原因。在部分双卡簧片折弯处发现有尖锐凹角并有明显微裂纹 ,裂纹表面有镍和铜 ,说明裂纹是在成形加工过程中形成。双卡簧片成形时弯角较尖锐并有明显裂纹是导致失效的原因
【Abstract】 Failure causes of double clip reed were analyzed by means of optical microscopy, scanning electron microscopy, electron probe microanalysis and micro hardness tester. Nickel and copper elemens on crack surface showed crack formation during forming process. It was concluded that failure of double clip reed was the result of local stress concentration and cracking at the sharp elbow of reed.
【关键词】 簧片;
金相;
扫描电镜;
失效分析;
【Key words】 Reed Metallography Scanning electron microscopy Failure analysis;
【Key words】 Reed Metallography Scanning electron microscopy Failure analysis;
- 【文献出处】 理化检验(物理分册) ,Physical Testing and Chemical Analysis Parta Physical Testing , 编辑部邮箱 ,2000年02期
- 【分类号】TG115
- 【下载频次】58