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热压NiAl纳米晶块体材料的HREM观察及EDS分析
HREM OBSERVATION AND EDS ANALYSIS OF NANOCRYSTALLINE BULK NiAl SYNTHESIZED BY MECHANICAL ALLOYING AND HOT PRESSING
【摘要】 利用高分辨电镜(HREM)及场发射电镜纳米尺度成分分析技术(EDS分析)研究了机械合金化和真空热压技术制备 的纳米 NIAI块体材料的微观结构. HREM及 EDS分析结果表明在球磨过程中形成第二相粒子 Al2O3分布于 NiAl晶粒内 部或边界上,分布于晶粒边界上的 Al2O3对晶界起钉扎作用,有效地抑制晶粒长大;此外,观察到纳米晶粒间存在无序区,这些 无序区也是抑制晶粒长大的一个因素
【Abstract】 The microstructure of bulk nanocrystalline NiAl (NC-NiAl) synthesized by mechanical alloying (MA) and hot pressing has been revealed by high-resolution electronic microscopy (HREM) and the energy dispersive X-ray spectroscopy (EDS) analysis. Results show that the second phase particles, Al2O3, formed during MA distribute within NiAl grains or at the boundaries of NiAl, which contributes to inhibiting the grain growth. In addition, disordered regions between NiAl grains have also been observed, which also contributes to inhibiting the grain growth.
- 【文献出处】 金属学报 ,ACTA METALLRUGICA SINICA , 编辑部邮箱 ,2000年09期
- 【分类号】TB383
- 【被引频次】7
- 【下载频次】336