【摘要】 介绍了在加速器质谱学中发展的入射离子 X射线的探测技术 ,以便应用于测定中重同位素的同量异位素鉴别 .描述了在中国原子能科学研究院加速器质谱计上建立的入射离子 X射线探测装置和实验结果 .通过测量入射离子 X射线 ,实现了 64 Cu测量中对同量异位素 64 Ni和 64 Zn的鉴别 ,以及 79Se测量中对 79Br的鉴别 .更多还原

【Abstract】 In recent years, a new technique to detect the charteristic X ray from projectile ions in accelerator mass spectrometry (AMS) has been developed. After analysis in the routine AMS system, the ions are stopped in an appropriately chosen target in steat of an ion detector and induced X ray are detected for identification of ions by atomic number. For the application of AMS to higher mass isotopes with mass number>20 using small accelerator, the characteristic X rays technique is better than the energy loss method for identification of atomic isobars. For analysis of heavy isotopes, a detection system of projectile X ray has been set up at the China Institute of Atomic Energy for identification of isobars in the AMS. Some of results in recent measurement of 64 Cu and 79 Se were reported here. The 64 Cu ions were separated from its isobars, 64 Ni and 64 Cu, and 79 Se ions were separated from 79 Br.更多还原