【摘要】 :本文用XRD、SEM等分析手段 ,对用Sol -Gel法制备的Gel膜在不同热处理条件下处理后的KTN薄膜进行分析。发现热处理的气氛、升降温速率、烧结温度对薄膜的结构和形貌影响很大 ,并对其的影响进行了分析讨论。在合适的热处理条件下 ,在SrTiO3 ( 1 0 0 ,1 1 1 )衬底上制备出了高取向、晶粒大小均匀、排列紧密、纯钙钛矿结构的KTN薄膜更多还原

【Abstract】 The structure and morphology of KTN thin films derived from Sol-Gel method under different heat-treatment conditions were studied by XRD and SEM. The results indicated that they were influenced heavily by the heating and cooling rate, annealing temperature and atmosphere. The effect of heat treatment was analyzed and discussed, highly oriented perovskite KTN thin films were prepared under optimal conditions on SrTiO 3(100) and (111) substrates.更多还原