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纳米TiO2粉晶的正电子湮没寿命谱研究

Investigation of the PAT in Nanocrystalline TiO2 Powders Prepared by Sol-Gel Process

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【作者】 尹荔松危韧勇周歧发张进修

【Author】 YIN Lisong 1,WEI Renyong 1,ZHOU Qifa 2,ZHANG Jinxiu 2 (1.College of Information Engineering,Changsha Railway University,Changsha,410075,China; 2.Department of Physics,Zhongshan University,Guangzhou,510275,China)

【机构】 长沙铁道学院信息工程学院!湖南长沙410075中山大学物理系!广东广州510275

【摘要】 用溶胶 -凝胶法 (sol -gel)制备了纳米TiO2 微粉。应用正电子湮没寿命谱 (PAT)研究了纳米TiO2 的界面结构。PAT研究表明 ,sol-gel法制备的纳米TiO2 微粉中只存在两类缺陷 ,即与短寿命成分τ1对应的单空位尺寸的自由体积缺陷 ,以及与中等寿命成分τ2 对应的微孔洞缺陷。其缺陷数目及浓度随着粒子尺寸的改变有着显著的改变 ,表现出尺寸效应。

【Abstract】 Nanocrystalline TiO 2 was prepared by sol-gel process.The interfacial structures of nanocrystalline TiO 2 powder were studied by positron-annihilation technique (PAT).The investigation of PAT showed there were two defects in the TiO 2 powder prepared by sol-gel process:the lifetime τ 1 is attributed to positron trapping in vacancy-size volumes defect in the crystalline interfaces and the lifetime τ 2 is attributed to positron annihilation in microvoids defect at the intersections of interfaces.The number and density of defects changed with the annealing temperatures and grain-size of TiO 2 powder.That showed size effect.

【关键词】 TiO2正电子湮没缺陷纳米微粉
【Key words】 TiO2positron-annihilationdefectsnanocrystalline powder
  • 【文献出处】 功能材料 ,JOURNAL OF FUNCTIONAL MATERIALS , 编辑部邮箱 ,2000年03期
  • 【分类号】TB383
  • 【被引频次】12
  • 【下载频次】169
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