节点文献
单缝衍射场分布对测量精度的影响
FIELD DISTRIBUTION OF SLIT DIFFRACTION AND ITS INFLUENCE UPON MEASUREMENT ACCURACY
【摘要】 运用衍射的特性 ,可以测量狭缝的宽度、细丝的直径、薄板的厚度等参数 ,并可派生到测量反映物体的间隔、位移、应变、剖面以及其它与此相关联的变量。研究单缝衍射的场分布 ,有利于将对衍射的场分布计算的结果应用于测量之中 ,提高测量精度。列出了利用计算机对单缝衍射的极值点进行逐次逼近计算的结果 ,分析了对CCD/CCPD视频输出信号设置比较电平的高低对测量精度的影响
【Abstract】 The slit width,wire diameters and plate thickness can be measured by application of diffraction,and it can be derived to measure the variables of interval,displacement,strain,section and the others.To investigate the field distribution of slit diffraction are beneficial to increasing the measurement accuracy.The extreme values of slit diffraction are given by step by step approach with computer.The influence of selecting the level of comparator for video frequency output of CCD/CCPD upon measurement accuracy is analysed.
- 【文献出处】 北京机械工业学院学报 ,JOURNAL OF BEIJING INSTITUTE OF MACHINERY , 编辑部邮箱 ,2000年02期
- 【分类号】O436
- 【被引频次】1
- 【下载频次】112