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离子注入降低PtSi肖特基二极管的势垒高度
Reducing Barrier Height of PtSi Schotty Diode Using Ion Injection Doping
【摘要】 Pt Si肖特基二极管的势垒高度制约 Pt Si红外探测器的截止波长和量子效率 .在 Pt Si/Si界面注入 In+ 、B+ ,采用高浓度、浅层注入避免隧穿效应 ,用 Ar气保护热处理消除注入损伤 ,附加掩膜层控制离子注入深度 ,成功地将 Pt Si肖特基二极管的势垒高度降低到 0 .1 5e V.
【Abstract】 The cutoff wavelength and the quantum efficiency of PtSi infrared detector are restricted by its Schottky barrier height. A technique is developed of doping In\++ and B\++ at the PtSi/Si interface to reduce the barrier height to 0 15eV. Higher doping ion concentration and thin p + layer can avoid the tunneling effect. Annealing in Ar atmosphere relieves the doped defect, and additional mask layer controls the depth of ion doping.
【关键词】 PtSi;
肖特基二极管;
势垒高度;
离子注入;
【Key words】 PtSi; Schottky diode; barrier height; ion injection doping method;
【Key words】 PtSi; Schottky diode; barrier height; ion injection doping method;
- 【文献出处】 半导体学报 ,CHINESE JOURNAL OF SEMICONDUCTORS , 编辑部邮箱 ,2000年10期
- 【分类号】TN31
- 【被引频次】9
- 【下载频次】169