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MOCVD生长的高质量掺碳GaAs/AlGaAs材料的特性研究
Property of High Quality Carbon Doped GaAs/AlGaAs Materials Grown by MOCVD *
【摘要】 利用低压金属有机化合物汽相淀积方法,以液态CCl4 为掺杂源生长了高质量的碳掺杂GaAs/AlGaAs外延材料,研究了CCl4 流量、生长温度和Ⅴ/Ⅲ比等因素对外延材料中的碳掺杂水平的影响.采用电化学CV 方法、范德堡霍耳方法、低温光致发光谱和X射线双晶衍射回摆曲线测量等方法对碳掺杂外延材料的电学、光学特性进行了研究.实验制备了空穴浓度高达1.9×1020cm - 3的碳掺杂GaAs 外延材料和低温光致发光谱半宽小于5nm 的高质量碳掺杂Al0.3Ga0.7As 外延层.在材料研究的基础上,我们以碳为P型掺杂剂生长了GaAs/AlGaAs/InGaAs应变量子阱980nm 大功率半导体激光器结构,并获得了室温连续工作1W 以上的光功率输出.
【Abstract】 High quality carbon doped GaAs/AlGaAs materials are grown by low pressure\|Metalorganic Chemical Vapor Phase Deposition method,using liquid carbon tetrachloride as dopant.The dependency of doping level on growth parameters such as CCl\-4 molecular flow,growth temperature and Ⅴ/Ⅲ ratio is investigated.The electrical and optical properties are studied by electrochemistrical capacity voltage (CV),Hall effect,low temperature photoluminescence spectral and X\|ray double crystal diffraction methods.Highly carbon doped GaAs epitaxial layers with hole concentration up to 1.9×10 20 cm\+\{-3\} and high optical quality (PL FWHM less than 5nm) are obtained.GaAs/AlGaAs/InGaAs strained quantum well 980nm high power semiconductor laser structure are also grown,and the output light power of continuous wave laser is more than 1W at room temperature.
- 【文献出处】 半导体学报 ,CHINESE JOURNAL OF SEMICONDUCTORS , 编辑部邮箱 ,2000年01期
- 【分类号】TN304.055
- 【被引频次】5
- 【下载频次】198