节点文献
电阻率两种测试方法间几何效应修正的相关性
Relationship Between Geometric Effect Correction on Resistivity Measurement Methods
【摘要】 根据有限厚度样品体电阻率和薄层电阻两种测试方法间的厚度修正系数的相关性,论证了其边缘效应修正系数具有一一对应的严格的相等性。通过实验予以证明,并可将这一结论应用于非圆心点测试。
【Abstract】 This paper puts forward an equivalence relation of the correction factors for the boundary effect, according to the relation of the thickness correction factors between two measurement methods of the bulk resistivity and sheet resistance for the specimens with a finite thickness. It has been confirmed through experiment, and can be used for the measurement with the four-point probe out of the center of the specimens.
【关键词】 电阻率测量;
四探针;
几何效应修正;
【Key words】 Resistivity measurement Four-point probe Geometric effect correction;
【Key words】 Resistivity measurement Four-point probe Geometric effect correction;
- 【文献出处】 半导体技术 ,SEMICONDUCTOR TECHNOLOGY , 编辑部邮箱 ,2000年05期
- 【分类号】TN306
- 【被引频次】43
- 【下载频次】487