节点文献
光电双基区晶体管中的光控电流开关效应
The Photo controlled Current Switching in Photo Dual Base Transistor
【摘要】 光电双基区晶体管在光电混合模式工作条件下具有光控“S”型负阻特性及其光控电流开关效应。测量了光照时IBE-VBE特性、Ith(光阈值)-RC特性等曲线。并利用电注入双基区晶体管的“S”型负阻产生机理解释了测得的结果。
【Abstract】 In this paper,the photo controlled“S”negative resistance characteristics and the current switching effect have been found in the optical and electrical mixed operating mode on photo dual base transistor(PDUBAT).The I BE V BE and I th R C characteristics of PDUBAT under light have been measured.The measured results can be explained by the“S”negative resistance characteristic on electrical DUBAT device.
【关键词】 光电负阻器件;
光控电流开关;
【Key words】 Photo negative resistance device Photo controlled current switching;
【Key words】 Photo negative resistance device Photo controlled current switching;
【基金】 集成光电子学联合实验室开放课题资助
- 【文献出处】 半导体技术 ,SEMICONDUCTOR TECHNOLOGY , 编辑部邮箱 ,2000年01期
- 【分类号】TN364.3
- 【被引频次】7
- 【下载频次】37