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沉积温度为室温和560℃的Nb/Si多层膜微结构研究
Microstructure Studies of Nb/Si Multilayers Deposited at Room Temperature and 560 ℃
【摘要】 对多靶离子溅射制备的Nb/Si周期多层膜的微结构进行了实验研究。利用X射线衍射和截面透射电子显微镜观测到室温和 56 0℃沉积的Nb/Si多层膜为非晶多层膜 ,但它们的微结构有很大的不同。采用沉积原子表面活动性和界面反应程度解释了所得到的结果。
【Abstract】 The microstructures of Nb/Si multilayers prepared by ion beam sputtering technique have been studied by using XRD and CTEM.The XRD and CTEM observations demonstrate that significant differences in film morphology emerge for samples deposited at room temperature and 560 ℃ respectively .It is surface mobility of adatoms and interfacial reaction that play an important role in the growth of amorphous Nb/Si multilayers.
【关键词】 Nb/Si多层膜;
沉积温度;
界面结构;
【Key words】 Nb/Si multilayers; Deposition temperature; Interfacial structure;
【Key words】 Nb/Si multilayers; Deposition temperature; Interfacial structure;
【基金】 国家自然科学基金
- 【文献出处】 真空科学与技术 , 编辑部邮箱 ,1999年02期
- 【分类号】TN304.055
- 【被引频次】2
- 【下载频次】42