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S型曲线的扫描回归方法
THE METHOD OF SCANNING REGRESSION FOR DEALING WITH THE LOGISTIC CURVE
【摘要】 讨论S型曲线Y=k[1+bexp(-aX)]的最佳拟合问题,提出一种扫描回归的新方法,并利用实际数据说明,与普通回归相比,该扫描回归方法具有相关系数较大、精确度较高的优点
【Abstract】 In this paper, the question of best Logistic regression curve, Y=k/[1+b exp (-aX)] , is discussed. The paper gives a new method of regression by scanning. Applied to practical data, this method is proved to have higher accuracy with greater correlative coefficient than ordinary ways of regression.
- 【文献出处】 扬州大学学报(自然科学版) ,JOURNAL OF YANGZHOU UNIVENSITY NATARAL SCIENCE EDITION , 编辑部邮箱 ,1999年03期
- 【分类号】O212.1
- 【被引频次】8
- 【下载频次】138