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脉冲激光沉积制备c轴取向AlN薄膜
c axis Oriented AlN Thin Films Prepare d by Pulsed Excimer Laser Deposition
【摘要】 c轴取向的AlN 具有优异的压电性和声表面波传输特性,已受到人们日益广泛的重视。文章报道了采用KrF脉冲准分子激光沉积工艺,在Si(100)衬底上成功地制备了c轴取向的AlN晶态薄膜。X射线衍射与傅里叶变换红外光谱的结果表明,在300 °C~800 °C衬底温度下,薄膜均只有(002)一个衍射峰,但随着温度的升高,薄膜的结晶质量变好;原子力显微镜对800 °C沉积薄膜观察结果显示,薄膜具有高度一致的柱状结构,平均晶粒大小为250 nm 。
【Abstract】 A1N thin films have bee n successfully grown on Si(100) substrat es by krF pulsed excimer laser depostion . XRD, FTIR and AFM are employed to char acterize A1N films. The substractes temp erature plays an important role in fabri cating A1N films. The films deposited at 300 °C ~800 °C are (002) oriented and s how better crystalline properties at hig her temperatures. AFM observations of th e films deposited at 800 °C reveal fine grains with size of 250 nm, implying the columnar growth mechnism.
【Key words】 aluminum nitride; puls ed laser deposition (PLD); piezoelectric s;
- 【文献出处】 压电与声光 ,PIEZOELECTRICS & ACOUSTOOPTICS , 编辑部邮箱 ,1999年05期
- 【分类号】TN304.055
- 【被引频次】18
- 【下载频次】113