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等离子体源离子渗氮合成硼碳氮薄膜的研究
B-C-N Films Synthesized by Plasma Source Ion Nitriding
【摘要】 采用等离子体源离子渗氮,即低能(1-3keV)、超大剂量(1019~1020ions.cm-2)氮离子注入-同步热扩散技术,在300~500℃处理碳化硼薄膜,合成了硼碳氮三元薄膜.俄歇电子能谱和漫反射富氏变换红外光谱分析表明,合成的硼碳氮薄膜是碳硼比固定,氮含量可控的非晶态薄膜.300℃渗氮的薄膜由sp2型的硼、碳、氮微区构成,而500℃渗氮的薄膜则由sp3和sP2型复合的微区组成.较高的渗氮工艺温度促进sP3型结构的形成,渗氮工艺时间对薄膜结构的影响不显著.
【Abstract】 An amorphous boron-carbon-nitrogen film was syathesized by plasma source ion nitriding,that is nitrogen ion implantation at low energy (1-3 keV) and superhigh dose (1019-1020ions. cm(-2)) and simultaneously indiffusion. Auger electron spectroscopy and diffuse reflectanceFourier transform infrared spectra showed that the films are mainly composed of sp2 and sp3 plain(graphite- and Pyridine-like) microdomains with a fixed B/C ratio and a controllable nitrogencontent at a nitriding temperature of 500℃ for a nitriding time from 2 to 6 h. The formation ofsp3 plain microdomains strongly depends on the nitriding temperature and softly on the nitridingtime.
- 【文献出处】 无机材料学报 ,JOURNAL OF INORGANIC MATERIALS , 编辑部邮箱 ,1999年01期
- 【分类号】TG174.442
- 【被引频次】10
- 【下载频次】147