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平场光栅谱仪相对衍射效率测量
RELATIVE DIFFRACTION EFFICIENCY MEASUREMENT OF FLAT-FIELD SPECTROGRAPH
【摘要】 以激光碳等离子体作为软X射线源,同时用平场光栅谱仪、常栅距光栅谱仪测量了类氢和类氦离子谱线强度,以一级谱线强度为标准,给出了平场光栅谱仪高级次光谱的相对衍射效率。
【Abstract】 The spectral intensities are measured using a flat-field grating spectrograph and a equallyspaced grooves grating spectrograph with a laser-produced C-plasma as a soft X-ray source. The efficiencieson different diffraction orders are given relative to the first order.
【关键词】 平场光栅谱仪;
光谱测量;
衍射效率;
【Key words】 flat-field grating spectrograph; spectra measurement; diffraction efficiency;
【Key words】 flat-field grating spectrograph; spectra measurement; diffraction efficiency;
【基金】 中国工程物理研究院科学基金
- 【文献出处】 强激光与粒子束 ,HIGH POWER LASER & PARTICLE BEAMS , 编辑部邮箱 ,1999年06期
- 【分类号】TL817
- 【被引频次】2
- 【下载频次】104